APA aipamena

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES (1st ED.). Wiley.

Chicago Style aipamena

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

MLA aipamena

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.