APA Edition Citation

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES (1st ED.). Wiley.

Chicago Edition Citation

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

MLA Edition Citation

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

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