Citace podle APA

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES (1st ED.). Wiley.

Styl Chicago

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

Citace podle MLA

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

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