Cita APA

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES (1st ED.). Wiley.

Chicago Edition Citation

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

Cita MLA

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

Atenció: Aquestes cites poden no estar 100% correctes.