APA Citatie

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES (1st ED.). Wiley.

Chicago Style citaat

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

MLA citatie

STRONG,ALVIN W. RELIABILITY WEAR OUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES. 1st ED. Wiley.

Let op: Deze citaties zijn niet altijd 100% accuraat.