Ładuje się......
Ellipsometry at the nanoscale/
Kolejni autorzy: | Losurdo, Maria, Ed, Hingerl, Kurt, Ed |
---|---|
Format: | Printed Book |
Wydane: |
New York :
Springer,
2012.
|
Hasła przedmiotowe: |
Podobne zapisy
-
Ellipsometry: proceedings of the third international conference on wllipsometry
Wydane: (1976) -
Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons
od: Schubert, Mathias
Wydane: (2004) - Spectroscopic ellipsometry study of barrier width effect in self-organized InGaAs/GaAsQDs laser diodes /
-
Ellipsometry and polarized light
od: Azzam, R M A
Wydane: (1977) -
Gamin de paris in nineteenth-centuary visual culture: Delacroix, Hugo and the French social imaginary/
od: Marilyn R Brown
Wydane: (2017)