A carregar...
Ellipsometry at the nanoscale/
| Outros Autores: | Losurdo, Maria, Ed, Hingerl, Kurt, Ed |
|---|---|
| Formato: | Printed Book |
| Publicado em: |
New York :
Springer,
2012.
|
| Assuntos: |
Registos relacionados
-
Ellipsometry: proceedings of the third international conference on wllipsometry
Publicado em: (1976) -
Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons, and polaritons
Por: Schubert, Mathias
Publicado em: (2004) - Spectroscopic ellipsometry study of barrier width effect in self-organized InGaAs/GaAsQDs laser diodes /
-
Ellipsometry and polarized light
Por: Azzam, R M A
Publicado em: (1977) -
Gamin de paris in nineteenth-centuary visual culture: Delacroix, Hugo and the French social imaginary/
Por: Marilyn R Brown
Publicado em: (2017)