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| LEADER |
00670cam a22001695a 4500 |
| 020 |
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|a 9783642339554
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| 082 |
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|a 620.112 95
|b Q32
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| 245 |
0 |
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|a Ellipsometry at the nanoscale/
|c ed by Maria Losurdo and Kurt Hingerl.
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| 260 |
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|a New York :
|b Springer,
|c 2012.
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| 300 |
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|a xxiv, 730p.
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| 504 |
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|a Includes bibliographical references.
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| 650 |
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|a Ellipsometry.
|9 29794
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| 700 |
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|a Losurdo, Maria, Ed.
|9 29795
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| 700 |
|
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|a Hingerl, Kurt, Ed.
|9 29796
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| 942 |
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|c BK
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| 999 |
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|c 64776
|d 64776
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| 952 |
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|0 0
|1 0
|4 0
|6 620_112000000000000_95_Q32
|7 0
|9 56736
|a MGUL
|b MGUL
|c GEN
|d 2015-01-27
|e Current Books Bill No 884 dated 26.12.2014
|g 16295.92
|l 1
|o 620.112 95 Q32
|p 52652
|r 2018-09-28
|s 2018-09-19
|y BK
|