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Ellipsometry at the nanoscale/
| Other Authors: | , |
|---|---|
| Format: | Printed Book |
| Published: |
New York :
Springer,
2012.
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| Subjects: |
| Physical Description: | xxiv, 730p. |
|---|---|
| Bibliography: | Includes bibliographical references. |
| ISBN: | 9783642339554 |