Losurdo, M., & Hingerl, K. (2012). Ellipsometry at the nanoscale. Springer.
Chicago Edition CitationLosurdo, Maria, and Kurt Hingerl. Ellipsometry at the Nanoscale. New York: Springer, 2012.
MLA citiranjeLosurdo, Maria, and Kurt Hingerl. Ellipsometry at the Nanoscale. Springer, 2012.
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