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Advances in x-ray analysis

Xehetasun bibliografikoak
Egile Nagusiak: Barret, Charls S; Editor, Gilfrich, John V; Editor, Jenkins, Ron; Editor, Predecki, Paul K; Editor, Richardson, James W; Editor, Russ, John C; Editor
Formatua: Printed Book
Argitaratua: New York, Plenum Press 1988
Saila:31
Gaiak:
LEADER 010900000a22003130004500
020 |a 0-306-42932-2 
082 |a 543.62 M8 
100 |a Barret, Charls S; Editor 
100 |a Gilfrich, John V; Editor 
100 |a Jenkins, Ron; Editor 
100 |a Predecki, Paul K; Editor 
100 |a Richardson, James W; Editor 
100 |a Russ, John C; Editor 
245 |a Advances in x-ray analysis 
260 |a New York, Plenum Press 
260 |c 1988 
320 |a Conference on Application of X-Ray Analysis, University of Denver, Department of Engineering and JCPDS-International Centre for Diffraction Data  |e US  |g Denver  |i 1987 
460 |a 523p 
465 |a D 95.40 
490 |a 31 
500 |a ed by Charles S Barrett...et al 
500 |a Includes index 
650 |a Chemistry, Analytic 
650 |a Spectrum analysis 
650 |a X-ray spectroscopy 
650 |a X-rays-Industrial applications 
942 |c BK 
999 |c 5080  |d 5080 
952 |0 0  |1 0  |4 0  |6 543_620000000000000_M8  |7 0  |8 ENG  |9 4872  |a MGUL  |b MGUL  |d 2013-07-16  |e D 95.40  |l 0  |o 543.62 M8  |p 02191  |r 2013-07-16  |w 2013-07-16  |y BK