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Fundamentals of powder diffraction and structural characterization of materials

Detalhes bibliográficos
Main Authors:	Pecharsky, Vitalij K; Author, Zavalij, Peter Y; Author
Formato:	Printed Book
Publicado em:	New York, Springer 2009
Edição:	2nd ed
Assuntos:	Powders-Optical properties-Measurement X-ray Crystallography X-rays-Diffraction-Measurement

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