Fundamentals of powder diffraction and structural characterization of materials

Bibliographic Details
Main Authors:	Pecharsky, Vitalij K; Author, Zavalij, Peter Y; Author
Format:	Printed Book
Published:	New York, Springer 2009
Edition:	2nd ed
Subjects:	Powders-Optical properties-Measurement X-ray Crystallography X-rays-Diffraction-Measurement

Holdings details from MG University
Call Number:	548.83 P9
Copy	Live Status Unavailable

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