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Random testing of digital circuits: theory and applications

Bibliografske podrobnosti
Glavni avtor:	David, Rene; Author
Format:	Printed Book
Izdano:	New York, Marcel Dekker 1998
Teme:	Digital integrated circuits; Testing

Podrobnosti zaloge MG University
Signatura:	621.381 5 N8
Kopija	Zaloga ni dosegljiva

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