APA aipamena

David, R. A. (1998). Random testing of digital circuits: Theory and applications.

Chicago Style aipamena

David, Rene; Author. Random Testing of Digital Circuits: Theory and Applications. New York, Marcel Dekker, 1998.

MLA aipamena

David, Rene; Author. Random Testing of Digital Circuits: Theory and Applications. 1998.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.