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Charecterization and behaviour of materials with submicron dimensions

Bibliographic Details
Main Author: Waber, James T; Ed
Format: Printed Book
Published: Singapore, World scientific 1985
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100 |a Waber, James T; Ed 
245 |a Charecterization and behaviour of materials with submicron dimensions 
260 |a Singapore, World scientific 
260 |c 1985 
465 |a D 38 
942 |c BK 
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