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Scanning electron microscopy and x-ray microanalysis /

Xehetasun bibliografikoak
Egile nagusia:	Goldstein, Joseph I
Formatua:	Printed Book
Argitaratua:	New York: Springer, 2018.
Edizioa:	4th ed.
Gaiak:	Scanning electron microscopy X-ray microanalysis
Sarrera elektronikoa:	https://books.google.co.in/books?id=wq7eBwAAQBAJ&printsec=frontcover&dq=9781493966745&hl=en&sa=X&ved=0ahUKEwiyl83ci97gAhVMRo8KHeVEDOEQ6AEIKDAA#v=onepage&q&f=false

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