Lanean...
Scanning electron microscopy and x-ray microanalysis /
| Egile nagusia: | |
|---|---|
| Formatua: | Printed Book |
| Argitaratua: |
New York:
Springer,
2018.
|
| Edizioa: | 4th ed. |
| Gaiak: | |
| Sarrera elektronikoa: | https://books.google.co.in/books?id=wq7eBwAAQBAJ&printsec=frontcover&dq=9781493966745&hl=en&sa=X&ved=0ahUKEwiyl83ci97gAhVMRo8KHeVEDOEQ6AEIKDAA#v=onepage&q&f=false |
| Deskribapen fisikoa: | 550 p. |
|---|---|
| ISBN: | 9781493966745 |