APA Edition Citation

Renjana G Nair & Radhadevi D S(Guide). (2006). Genetic analysis of yield and fusarium wilt resistance in line x tester progeny of yard long bean (vigna unguiculata subsp. sesquipedalis (L) verdcourt). Department of Plant Breeding and Genetics, College of Agriculture.

Chicago Edition Citation

Renjana G Nair and Radhadevi D S(Guide). Genetic Analysis of Yield and Fusarium Wilt Resistance in Line X Tester Progeny of Yard Long Bean (vigna Unguiculata Subsp. Sesquipedalis (L) Verdcourt). Vellayani: Department of Plant Breeding and Genetics, College of Agriculture, 2006.

MLA Edition Citation

Renjana G Nair and Radhadevi D S(Guide). Genetic Analysis of Yield and Fusarium Wilt Resistance in Line X Tester Progeny of Yard Long Bean (vigna Unguiculata Subsp. Sesquipedalis (L) Verdcourt). Department of Plant Breeding and Genetics, College of Agriculture, 2006.