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Multiple beam interferometry of surfaces and films
| Autor principal: | |
|---|---|
| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
New York
Dover
1970
|
| Matèries: |
interference
> Analysis, spectrum
> Spectra
> Spectrochemistry
> Spectroscopy
> Mass spectroscopy
> NMR spectroscopy
> IR spectroscopy
> Infrared spectroscopy
> nmr
> Optics
> Astrophysics
> Chemistry
> Radiation
> Light
> Photometry
> Optics
> Colour
> Optical storage devices
> Spectrum analysis
> Phosphoresence
> Spectroscopy
> Physics
> Optical physics
|
UL
| Signatura: |
535.41 TOL |
|---|---|
| Còpia | Comprovació en temps real no disponible |