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Multiple beam interferometry of surfaces and films
| Autor principal: | |
|---|---|
| Format: | Printed Book |
| Idioma: | English |
| Publicat: |
New York
Dover
1970
|
| Matèries: |
interference
> Analysis, spectrum
> Spectra
> Spectrochemistry
> Spectroscopy
> Mass spectroscopy
> NMR spectroscopy
> IR spectroscopy
> Infrared spectroscopy
> nmr
> Optics
> Astrophysics
> Chemistry
> Radiation
> Light
> Photometry
> Optics
> Colour
> Optical storage devices
> Spectrum analysis
> Phosphoresence
> Spectroscopy
> Physics
> Optical physics
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| 245 | |a Multiple beam interferometry of surfaces and films | ||
| 250 | |||
| 260 | |a New York |b Dover |c 1970 | ||
| 300 | |a vi, 186p., illus. | ||
| 500 | |a | ||
| 100 | |a Tolansky, S | ||
| 700 | |||
| 942 | |c BK |6 _ | ||
| 653 | |a interference |a Analysis, spectrum |a Spectra |a Spectrochemistry |a Spectroscopy |a Mass spectroscopy |a NMR spectroscopy |a IR spectroscopy |a Infrared spectroscopy |a nmr |a Optics |a Astrophysics |a Chemistry |a Radiation |a Light |a Photometry |a Optics |a Colour |a Optical storage devices |a Spectrum analysis |a Phosphoresence |a Spectroscopy |a Physics |a Optical physics | ||
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