Tolansky, S. (1970). Multiple beam interferometry of surfaces and films. Dover.
Chicago Style citaatTolansky, S. Multiple Beam Interferometry of Surfaces and Films. New York: Dover, 1970.
MLA citatieTolansky, S. Multiple Beam Interferometry of Surfaces and Films. Dover, 1970.
Let op: Deze citaties zijn niet altijd 100% accuraat.