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Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
| Autor Principal: | |
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| Formato: | Ph.D Thesis |
| Idioma: | English |
| Publicado: |
Kochi
Dept.of Physics - CUSAT
2004
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| Subjects: |
UL
| Número de Clasificación: |
535.8 PAU |
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| Copia | Live Status Unavailable |