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Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
| Hovedforfatter: | |
|---|---|
| Format: | Ph.D Thesis |
| Sprog: | English |
| Udgivet: |
Kochi
Dept.of Physics - CUSAT
2004
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| Fag: |
UL
| Klassifikationsnummer: |
535.8 PAU |
|---|---|
| Kopi | Live Status Unavailable |