Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco

Bibliographic Details
Main Author: Paulraj, M.
Format: Ph.D Thesis
Language:English
Published: Kochi Dept.of Physics - CUSAT 2004
Subjects:
Optics > Photothermal deflection spectroslopy > Guide : Vijayakumar, K.P.
LEADER 00697nam a22001697a 4500
005 20151026125937.0
008 090805t xxu||||| |||| 00| 0 eng d
080 |a 535.8  |b PAU 
100 |a Paulraj, M.  |9 1721 
245 |a Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco 
300 |a 256p. 
653 |a Optics  |a Photothermal deflection spectroslopy  |a Guide : Vijayakumar, K.P. 
942 |c TH  |6 _ 
260 |a Kochi  |b Dept.of Physics - CUSAT  |c 2004  |9 1722 
500 |a Thesis (Ph.D),CUSAT, 2004 Guide : Vijayakumar, K.P. 
999 |c 763  |d 763 
952 |0 0  |1 0  |2 udc  |4 0  |6 5358_PAU  |7 0  |9 2420  |a UL  |b UL  |d 2009-08-05  |o 535.8 PAU  |p G0009050  |r 2009-08-05  |w 2009-08-05  |y TH 

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