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Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
| Príomhúdar: | |
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| Formáid: | Ph.D Thesis |
| Teanga: | English |
| Foilsithe: |
Kochi
Dept.of Physics - CUSAT
2004
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| Ábhair: |
| Cur Síos ar an Mír: | Thesis (Ph.D),CUSAT, 2004 Guide : Vijayakumar, K.P. |
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| Cur Síos Fisiciúil: | 256p. |