Nalaganje...
Physical aspects of electron microscopy and microbeam analysis
| Glavni avtor: | Siegel, Benyamin M. |
|---|---|
| Drugi avtorji: | Beaman, Donald R. |
| Format: | Printed Book |
| Jezik: | English |
| Izdano: |
New york
John wiley
1975
|
| Teme: |
Podobne knjige/članki
-
Quantitative microbeam analysis
od: Fitzgerald, A G, Ed., et al
Izdano: (1993) -
Electron microscopy and analysis
od: Goodhew, Peter J, et al
Izdano: (2001) -
Introduction to electron microscopy
od: Wischnitzer, Saul
Izdano: (1970) -
Principles and practice of electron microscopy
od: Watt, Ian M
Izdano: (1989) -
Electron microscopy methods and protocols
od: Hajibagheri, M A Nasser, Ed
Izdano: (1999)