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00708nam a2200169 a 4500 |
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20151028162140.0 |
| 008 |
960221s1955 dcuabcdjdbkoqu001 0deng d |
| 003 |
ViArRB |
| 082 |
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|a 578.45
|b l5
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| 100 |
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|a Siegel, Benyamin M.
|9 21966
|
| 245 |
|
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|a Physical aspects of electron microscopy and microbeam analysis
|c Jointly sponsored by Electron Microscopy Society of America and the Microbeam Analysis Society
|
| 653 |
|
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|a Electron microscopes
|a Electron microscopes
|
| 700 |
|
|
|a Beaman, Donald R.
|9 21965
|
| 942 |
|
|
|c BK
|6 _
|
| 260 |
|
|
|a New york
|b John wiley
|c 1975
|
| 999 |
|
|
|c 76120
|d 76120
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 57845_L5
|7 0
|9 88853
|a SOS
|b SOS
|c CART
|d 2010-03-22
|l 1
|o 578.45 L5
|p MS002879
|r 2014-03-18
|s 2014-02-21
|w 2009-07-13
|y BK
|