APA-referens

Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis. John wiley.

Chicago-stil citat

Siegel, Benyamin M., och Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. New york: John wiley, 1975.

MLA-referens

Siegel, Benyamin M., och Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. John wiley, 1975.