Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis. John wiley.
シカゴスタイル引用形Siegel, Benyamin M., , Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. New york: John wiley, 1975.
MLA引用形式Siegel, Benyamin M., , Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. John wiley, 1975.
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