एपीए उद्धरण

Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis. John wiley.

शिकागो स्टाइल उद्धरण

Siegel, Benyamin M., और Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. New york: John wiley, 1975.

एमएलए उद्धरण

Siegel, Benyamin M., और Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. John wiley, 1975.