Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis. John wiley.
Chicago Edition CitationSiegel, Benyamin M., and Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. New york: John wiley, 1975.
Deismireacht MLASiegel, Benyamin M., and Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. John wiley, 1975.
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