Style de citation APA

Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis. John wiley.

Style de citation Chicago

Siegel, Benyamin M., et Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. New york: John wiley, 1975.

Style de citation MLA

Siegel, Benyamin M., et Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. John wiley, 1975.

Attention : ces citations peuvent ne pas être correctes à 100%.