Introduction to Scanning Tunneling Microscopy

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Bibliografske podrobnosti
Glavni avtor: Chen, C. Julian
Format: eKnjiga
Jezik:English
Izdano: OUP 2007
Izdaja:2nd ed.
Teme:
Scanning Tunneling Microscopy (STM) > Atomic Force Microscope (AFM)
Online dostop:http://www.oxfordscholarship.com/view/10.1093/acprof:oso/9780199211500.001.0001/acprof-9780199211500

Internet

http://www.oxfordscholarship.com/view/10.1093/acprof:oso/9780199211500.001.0001/acprof-9780199211500

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