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Introduction to Scanning Tunneling Microscopy

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书目详细资料
主要作者:	Chen, C. Julian
格式:	电子书
语言:	English
出版:	OUP 2007
版:	2nd ed.
主题:	Scanning Tunneling Microscopy (STM) > Atomic Force Microscope (AFM)
在线阅读:	http://www.oxfordscholarship.com/view/10.1093/acprof:oso/9780199211500.001.0001/acprof-9780199211500

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