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Introduction to Scanning Tunneling Microscopy

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Xehetasun bibliografikoak
Egile nagusia:	Chen, C. Julian
Formatua:	eBook
Hizkuntza:	English
Argitaratua:	OUP 2007
Edizioa:	2nd ed.
Gaiak:	Scanning Tunneling Microscopy (STM) > Atomic Force Microscope (AFM)
Sarrera elektronikoa:	http://www.oxfordscholarship.com/view/10.1093/acprof:oso/9780199211500.001.0001/acprof-9780199211500

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