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High-Resolution Electron Microscopy

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Bibliografske podrobnosti
Glavni avtor:	Spence, John C. H.
Format:	eKnjiga
Jezik:	English
Izdano:	OUP 2014
Teme:	High resolution electron microscopy. > Atomic-resolution TEM > Scanning Transmission Electron Microscopy (STEM)
Online dostop:	http://www.oxfordscholarship.com/view/10.1093/acprof:oso/9780199668632.001.0001/acprof-9780199668632

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