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Fringe pattern analysis for optical metrology theory, algorithms and applications
| 第一著者: | Servin, Manuel |
|---|---|
| その他の著者: | Quiroga, Antonio J, Padilla, Moises J |
| フォーマット: | Printed Book |
| 言語: | English |
| 出版事項: |
Germany
Wiley-VCH
2014
|
| 主題: |
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