Á lódáil...
Fringe pattern analysis for optical metrology theory, algorithms and applications
| Príomhúdar: | Servin, Manuel |
|---|---|
| Údair Eile: | Quiroga, Antonio J, Padilla, Moises J |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
Germany
Wiley-VCH
2014
|
| Ábhair: |
Míreanna Comhchosúla
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