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Fringe pattern analysis for optical metrology theory, algorithms and applications
| Egile nagusia: | Servin, Manuel |
|---|---|
| Beste egile batzuk: | Quiroga, Antonio J, Padilla, Moises J |
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Germany
Wiley-VCH
2014
|
| Gaiak: |
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