Fringe pattern analysis for optical metrology theory, algorithms and applications

Bibliographic Details
Main Author: Servin, Manuel
Other Authors: Quiroga, Antonio J, Padilla, Moises J
Format: Printed Book
Language:English
Published: Germany Wiley-VCH 2014
Subjects:
Interferometry
Metrology
Optical measurements
Diffraction patterns

UL

Holdings details from UL
Call Number: 535.241 SER
Copy Live Status Unavailable

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