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| LEADER |
00795 a2200229 4500 |
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20151026133349.0 |
| 008 |
150121b xxu||||| |||| 00| 0 eng d |
| 020 |
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|a 9783527411528
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| 080 |
|
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|a 535.241
|b SER
|
| 100 |
|
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|a Servin, Manuel
|
| 245 |
|
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|a Fringe pattern analysis for optical metrology
|b theory, algorithms and applications
|c Manuel Servin, J Antonio Quiroga and J Moises Padilla
|
| 260 |
|
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|c 2014
|b Wiley-VCH
|a Germany
|
| 300 |
|
|
|a xvi, 327p.
|
| 653 |
|
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|a Interferometry
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| 653 |
|
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|a Metrology
|
| 653 |
|
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|a Optical measurements
|
| 653 |
|
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|a Diffraction patterns
|
| 700 |
|
|
|a Quiroga, Antonio J
|
| 700 |
|
|
|a Padilla, Moises J
|
| 942 |
|
|
|c BK
|6 _
|
| 999 |
|
|
|c 69253
|d 69253
|
| 952 |
|
|
|0 0
|1 0
|2 udc
|4 0
|6 535241_SER
|7 0
|9 81372
|a UL
|b UL
|d 2015-01-21
|o 535.241 SER
|p 00072086
|r 2015-01-21
|w 2015-01-21
|y BK
|