Servin, M., Quiroga, A. J., & Padilla, M. J. (2014). Fringe pattern analysis for optical metrology: Theory, algorithms and applications. Wiley-VCH.
シカゴスタイル引用形Servin, Manuel, Antonio J. Quiroga, , Moises J. Padilla. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms and Applications. Germany: Wiley-VCH, 2014.
MLA引用形式Servin, Manuel, et al. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms and Applications. Wiley-VCH, 2014.
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