एपीए उद्धरण

Servin, M., Quiroga, A. J., & Padilla, M. J. (2014). Fringe pattern analysis for optical metrology: Theory, algorithms and applications. Wiley-VCH.

शिकागो स्टाइल उद्धरण

Servin, Manuel, Antonio J. Quiroga, और Moises J. Padilla. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms and Applications. Germany: Wiley-VCH, 2014.

एमएलए उद्धरण

Servin, Manuel, et al. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms and Applications. Wiley-VCH, 2014.