Fundamentals of modern VLSI devices

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Bibliographic Details
Main Author: Taur, Yuan
Other Authors: Ning, TYak H
Format: Printed Book
Language:English
Published: Cambridge Cambridge University Press 2013
Edition:2nd ed.
Subjects:
VLSI - Integrated circuits
Metal oxide semiconductors
Bipolar transistors

UL

Holdings details from UL
Call Number: 621.3.049.77 TAU
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