Document analysis and recognition with wavelet and fractal theories

Bibliografske podrobnosti
Glavni avtor: Tang, Yuan Tan
Format: Printed Book
Jezik:English
Izdano: Singapore World scientific publishing 2012
Serija:Series in machine perception and artificial intelligence; V.79
Teme:
Document imaging system
Fractal wavelets
Pattern recognition

UL

Podrobnosti zaloge UL
Signatura: 004.93'1 TAN
Kopija Zaloga ni dosegljiva

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