Document analysis and recognition with wavelet and fractal theories

Bibliographic Details
Main Author: Tang, Yuan Tan
Format: Printed Book
Language:English
Published: Singapore World scientific publishing 2012
Series:Series in machine perception and artificial intelligence; V.79
Subjects:
Document imaging system
Fractal wavelets
Pattern recognition

UL

Holdings details from UL
Call Number: 004.93'1 TAN
Copy Live Status Unavailable

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