Document analysis and recognition with wavelet and fractal theories

Detalles Bibliográficos
Autor Principal: Tang, Yuan Tan
Formato: Printed Book
Idioma:English
Publicado: Singapore World scientific publishing 2012
Series:Series in machine perception and artificial intelligence; V.79
Subjects:
Document imaging system
Fractal wavelets
Pattern recognition
Descripción
Descrición Física:xv, 356p.
ISBN:9789814401005

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