Materials characterization techniques

Bibliographic Details
Main Author:	Zhang, Sam
Other Authors:	Li, Lin, Kumar, Ashok
Format:	Printed Book
Language:	English
Published:	CRC press 2009 Boca Ration
Subjects:	Material - testing techniques Electron spectroscopy UV spectroscopy X-ray diffraction

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by: Philip Mathew, Preeja R. Nair, Sheelakumari Issac, Jayakumari Isac
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Strain and dislocation gradients from diffraction spatially-resolved local structure and defects
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Elements of X-ray diffraction
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Basic concepts of X-ray diffraction
by: ZOLOTOYABKO,Emil
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Elements of X-ray diffraction
by: Cullity, B D; Stock S R
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Elements of X-ray diffraction
by: Cullity, B D; Stock S R
Published: (2018)

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Elements of X-ray diffraction
by: Cullity, B D; Stock S R
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x-ray absorption spectroscopy of semiconductors
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Materials characterization techniques /
by: Zhang, Sam
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by: Cullity, B. D.
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Coherent X-Ray Optics
by: Paganin, David
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by: Drits, Victor A
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X-ray diffraction
by: Azaroff, Leonid V, et al
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by: Kemp, William
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A practical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis /
Published: (1998)

Materials characterization techniques Sam Zhang, Lin Li and Ashok kumar

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