Cita APA

Leach, R. K. (2010). Fundamental principles of engineering nanometrology. Elsevier.

Citación estilo Chicago

Leach, Richard K. Fundamental Principles of Engineering Nanometrology. Amsterdam: Elsevier, 2010.

Cita MLA

Leach, Richard K. Fundamental Principles of Engineering Nanometrology. Elsevier, 2010.

Warning: These citations may not always be 100% accurate.