Leach, R. K. (2010). Fundamental principles of engineering nanometrology. Elsevier.
Chicago Edition CitationLeach, Richard K. Fundamental Principles of Engineering Nanometrology. Amsterdam: Elsevier, 2010.
Cita MLALeach, Richard K. Fundamental Principles of Engineering Nanometrology. Elsevier, 2010.
Atenció: Aquestes cites poden no estar 100% correctes.